1.

Conference Proceedings
Conference Proceedings
1. The Role of Metal and Passivation Defects in Electromigration-Induced Damage in Thin Film Conductors
Lloyd, J. R. ; Smith, P. M. ; Prokop, G. S.
Pub. info.: Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.397-408,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 10
2.

Conference Proceedings
Conference Proceedings
2. Formation and Growth of Voids and/or Gas Bubbles in Thin Films
Lloyd, J. R. ; Nakahara, S.
Pub. info.: Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.289-296,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 10
3.

Conference Proceedings
Conference Proceedings
3. QUICK TESTS FOR ELECTROMIGRATION: USEFUL BUT NOT WITHOUT DANGER
Lloyd, J. R.
Pub. info.: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.735-744,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 260
4.

Conference Proceedings
Conference Proceedings
4. MECHANICAL STRESS AND ELECTROMIGRATION FAILURE
Lloyd, J. R.
Pub. info.: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.47-52,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 225
5.

Conference Proceedings
Conference Proceedings
5. ELECTROMIGRATION INDUCED RESISTANCE CHANGES IN PASSIVATED ALUMINUM THIN FILM CONDUCTORS
Mockl, U. E. ; Lloyd, J. R. ; Arzt, E.
Pub. info.: Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.301-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 309
6.

Conference Proceedings
Conference Proceedings
6. THE FINITE ELECTROMIGRATION BOUNDARY VALUE PROBLEM
Lloyd, J. R. ; Kitchin, J.
Pub. info.: Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.339-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 309
7.

Conference Proceedings
Conference Proceedings
7. Electromigration-Induced Failure as a Function of Via Interface
Kisselgof, Larisa ; Lloyd, J. R.
Pub. info.: Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A..  pp.401-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 473
8.

Conference Proceedings
Conference Proceedings
8. Stress and Electromigration
Lloyd, J. R.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.231-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391
9.

Conference Proceedings
Conference Proceedings
9. Failure in Tungsten-Filled Via Structures
Clement, J. J. ; Lloyd, J. R. ; Thompson, C. V.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.423-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391
10.

Conference Proceedings
Conference Proceedings
10. *ELECTROMIGRATION FAILURE AND MECHANICAL STRESS IN THIN FILM CONDUCTORS
Lloyd, J. R.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.667-676,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
11.

Conference Proceedings
Conference Proceedings
11. INVESTIGATIONS ON A NEW FAILURE MODEL FOR ELECTROMIGRAT ION
Kitchin, J. ; Lloyd, J. R.
Pub. info.: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.27-34,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 225
12.

Conference Proceedings
Conference Proceedings
12. ELECTROMIGRATION LIFETIME AND STEP COVERAGE IN Al/Cu/Si THIN FILM CONDUCTORS
Kisselgof, Larisa ; Elliott, L. J. ; Maziarz, J. J. ; Lloyd, J. R.
Pub. info.: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.107-112,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 225
13.

Conference Proceedings
Conference Proceedings
13. 30 Years of Electromigration Research: A Grand Masters' Perspective
Lloyd, J. R.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.3-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428
14.

Conference Proceedings
Conference Proceedings
14. Reactivity of Tricoordinated Phosphorus Compounds: A Mechanistic Study with a Variety of Substrates
Hall, C.D. ; Edwards, R. C. ; Lloyd, J. R. ; Beer, P. D. ; Hammond, P. J. ; d'Amorim, A. O. ; Melrose, M. P.
Pub. info.: Phosphorus chemistry : proceedings of the 1981 International Conference.  pp.551-,  1981.  Washington, D.C..  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 171
15.

Technical Paper
Technical Paper
15. New Effects in Interfacial Heat and Mass Transfer of Boiling and Evaporation in Micro-Scale Porous Materials.
Leontiev, A. I. ; Lloyd, J. R. ; Malyshenko, S. P. ; Borzenko, V. I. ; Dunikov, D. O.
Pub. info.: A.S.M.E. paper.  2003.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : IMECE
Ser. no.: 2003