1.

Conference Proceedings
Conference Proceedings
1. Monitoring of SO2 emissions from industry by passive DOAS
Li, A. ; Liu, C. ; Xie, P. ; Liu, J. ; Qin, M. ; Dou, K. ; Fang, W. ; Liu, W.
Pub. info.: Optical technologies for atmospheric, ocean, and environmental studies : 18-22 October 2004, Beijing, China.  pp.371-378,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5832
2.

Conference Proceedings
Conference Proceedings
2. Remote sensing of on-road motor vehicle emissions by DOAS and TDLAS techniques
Liu, J. ; Liu, W. ; Dong, F. ; Xie, P. ; Zhang, Y. ; Wei, Q.
Pub. info.: Optical technologies for atmospheric, ocean, and environmental studies : 18-22 October 2004, Beijing, China.  pp.74-82,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5832
3.

Conference Proceedings
Conference Proceedings
3. Remote sensing system of monitoring on-road vehicle emissions based on a tunable infrared differential absorption spectrometer and the UV DOAS
Zhang, Y. ; Liu, W. ; Qi, F. ; Xie, P. ; Tu, X. ; Liu, J. ; Wang, M.
Pub. info.: Optical technologies for atmospheric, ocean, and environmental studies : 18-22 October 2004, Beijing, China.  pp.636-643,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5832
4.

Conference Proceedings
Conference Proceedings
4. A new type UV-visible DOAS system based on photodiode array (PDA)
Qin, M. ; Xie, P. ; Liu, J. ; Liu, W. ; Fang, W. ; Lu, F. ; Li, A. ; Dou, K. ; Liu, S. ; Wei, Q.
Pub. info.: Optical technologies for atmospheric, ocean, and environmental studies : 18-22 October 2004, Beijing, China.  pp.721-731,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5832