1.

Conference Proceedings

Conference Proceedings
Liu, X. ; Liu, J. ; Li, X. ; Cheong, S.-K. ; Shu, D. ; Wang, J. ; Tate, M.W. ; Ercan, A. ; Schuette, D.R. ; Renzi, M.J. ; Woll, A. ; Gruner, S.M.
Pub. info.: Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA.  pp.21-28,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5535
2.

Conference Proceedings

Conference Proceedings
Li, J. ; Liu, J. ; Li, X. ; Liu, Y. ; Hao, Z.
Pub. info.: Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China.  pp.536-542,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5633
3.

Conference Proceedings

Conference Proceedings
Li, X. ; Dong, J.W. ; Liu, J. ; Feng, M.F.
Pub. info.: Optical design and testing : 15-18 October 2002, Shanghai, China.  pp.512-515,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4927
4.

Conference Proceedings

Conference Proceedings
Dong, J.W. ; Li, X. ; Liu, J. ; Feng, M.F.
Pub. info.: Optical design and testing : 15-18 October 2002, Shanghai, China.  pp.455-459,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4927
5.

Conference Proceedings

Conference Proceedings
Jin, C. ; Liu, J. ; Li, X. ; Coyle, C. ; Birnbaum, J. ; Fryxell, G.E. ; Williford, R.E. ; Baskaran, S.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D4.5-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612