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Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.21-28, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China. pp.536-542, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Optical design and testing : 15-18 October 2002, Shanghai, China. pp.512-515, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical design and testing : 15-18 October 2002, Shanghai, China. pp.455-459, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Jin, C. ; Liu, J. ; Li, X. ; Coyle, C. ; Birnbaum, J. ; Fryxell, G.E. ; Williford, R.E. ; Baskaran, S.
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Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A.. pp.D4.5-, 2001. Warrendale, PA. Materials Research Society