1.

Conference Proceedings
Conference Proceedings
1. Failure analysis of PC MCT caused by current [5964-46]
Liu, D. ; Wu, L. ; Yuan, Y. ; Zhang, L. ; Jin, X. ; Gong, H.
Pub. info.: Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany.  pp.596415-596415,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5964
2.

Conference Proceedings
Conference Proceedings
2. A feasible thermal-cycle screening system for cryogenic semiconductor components
Wu, L. ; Liu, D. ; Huang, Y. ; Zhu, S. ; Gong, H.
Pub. info.: Infrared components and their applications : 8-11 November 2004, Beijing, China.  pp.85-93,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5640