1.

Conference Proceedings
Conference Proceedings
1. Intrinsic Gettering in Nitrogen Doped Czochralski Crystal Silicon
Yang, D. ; Fan, R. ; Shen, Y. ; Tian, D. ; Li, L. ; Que, D.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.357-364,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
2.

Conference Proceedings
Conference Proceedings
2. OXIDATION-INDUCED STACKING FAULTS IN NITROGEN DOPED CZOCHRALSKI SILICON
Yang, D. ; Chu, J. ; Ma, X. ; Li, L. ; Que, D.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.273-279,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
3.

Conference Proceedings
Conference Proceedings
3. OXIDATION-INDUCED STACKING FAULTS IN NITROGEN DOPED CZOCHRALSKI SILICON
Yang, D. ; Chu, J. ; Ma, X. ; Li, L. ; Que, D.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.273-279,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2