1.

Conference Proceedings
Conference Proceedings
1. Development of microelectromechanical varactors
Lee,C.-H. ; Tsai,S.-H. ; Lin,C.-H. ; Maeda,R. ; Tsaur,J.-J. ; Fang,K.-J. ; Lu,J.-M. ; Lee,C. ; Fang,W.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2001 : 25-27 April 2001, Cannes, France.  pp.486-493,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4408
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Conference Proceedings
Conference Proceedings
2. Laser alignment strictness for optical diffraction effect in lithography processes
Lin,H.-P. ; Lee,C.-H. ; Lo,Y.-C. ; Lu,K.L.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.986-996,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
3.

Conference Proceedings
Conference Proceedings
3. Adaptive video watermarking using motion information
Lee,C.-H. ; Oh,H.-S. ; Lee,H.-K.
Pub. info.: Security and watermarking of multimedia contents II : 24-26 January 2000, San Jose, California.  pp.209-216,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3971
4.

Conference Proceedings
Conference Proceedings
4. Expanded nonlinear order dithering and modified error diffusion for an ink-jet color printer
Lee,C.-S. ; Lee,C.-H. ; Park,Y.-W. ; Ha,Y.-H.
Pub. info.: Color imaging : device-independent color, color hardcopy, and graphic arts IV : 26-29 January 1999, San Jose, California.  pp.541-550,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3648
5.

Conference Proceedings
Conference Proceedings
5. Nitride film surface properties to reduce nitride residue
Weng,F.T. ; Lee,C.-H. ; Lu,K.-L. ; Chyn,Y.-P.
Pub. info.: Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, San Clara, California.  pp.675-685,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3332
6.

Conference Proceedings
Conference Proceedings
6. Using differential confocal microscopy to detect the phase transition of the membrane of giant unilamellar liposomes
Lee,C.-H. ; Lin,W.-J. ; Wang,J.
Pub. info.: Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan.  pp.125-133,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4082
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Conference Proceedings
Conference Proceedings
7. Optimizing the clean effect of wafer backside in lithography developer process
Lin,H.-P. ; Chang,C.-H. ; Lee,C.-H. ; Pang,S.L. ; Lu,K.L.
Pub. info.: Process, equipment, and materials control in integrated circuit manufacturing V : 22-23 September, 1999, Santa Clara, California.  pp.193-199,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3882
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Conference Proceedings
Conference Proceedings
8. Linearity enhancement of EA modulator using SOA
Han,S.-K. ; Lee,C.-H. ; Sohn,S.-I.
Pub. info.: Integrated optics devices iv : 24-25 January, 2000, San Jose, California.  pp.58-65,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3936
9.

Conference Proceedings
Conference Proceedings
9. Digital halftoning based on color correction using neural network with uniform color samples and vector error diffusion
Lee,C.-H. ; Choi,W.-H. ; Lee,E.-J. ; Ha,Y.-H.
Pub. info.: Color imaging : device-independent color, color hardcopy, and graphic arts V : 25-28 January 2000, San Jose, California.  pp.415-422,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3963
10.

Conference Proceedings
Conference Proceedings
10. Digital image watermarking on a special object:the human face
Oh,H.-S. ; Chang,D.-H. ; Lee,C.-H. ; Lee,H.-K.
Pub. info.: Security and watermarking of multimedia contents II : 24-26 January 2000, San Jose, California.  pp.536-544,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3971
11.

Conference Proceedings
Conference Proceedings
11. Relation between film character and wafer alignment: critical alignment issues on HV device for VLSI manufacturing
Lo,Y.-C. ; Lee,C.-H. ; Lin,H.-P. ; Peng,C.-S.
Pub. info.: Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, San Clara, California.  pp.686-695,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3332
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Conference Proceedings
Conference Proceedings
12. Transmission of Directly Modulated 10Gb/s Signals over 340km of Non-Dispersion Shifted Fiber by Mid-Span Spectral Inversion,
Lee,S.-S. ; Lee,C.-H.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part1  pp.149-150,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
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Conference Proceedings
Conference Proceedings
13. High Mass Black Holes in Soft X-ray Transients
Brown,G.E. ; Lee,C.-H. ; Bethe,H.
Pub. info.: The neutron star-black hole connection.  pp.343-348,  2001.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series C, Mathematical and physical sciences
Ser. no.: 567
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Conference Proceedings
Conference Proceedings
14. Design criteria of buckling microbridges
Fang,W. ; Hu,H. ; Lee,C.-H.
Pub. info.: Micromachining and microfabrication process technology IV : 21-22 September, 1998, Santa Clara, California.  pp.288-296,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3511
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Conference Proceedings
Conference Proceedings
15. Comparison of best process focus and machine focus
Lo,Y.-C. ; Lee,C.-H. ; Fan,Y.-T. ; Chang,C.-K. ; Lu,K.L.
Pub. info.: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing III.  pp.241-248,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3213
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Conference Proceedings
Conference Proceedings
16. Tracing metal defect relating to yield for VLSI manufacturing
Loe,Y.-C. ; Lee,C.-H. ; Lin,C.-C. ; Yang,C.-M. ; Lu,K.L. ; Yang,J.J.
Pub. info.: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing II.  pp.45-56,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2876
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Conference Proceedings
Conference Proceedings
17. Best process focus and machine focus: adding focus offset to optimize photolithography process for VLSI manufacturing
Lo,Y.-C. ; Lee,C.-H. ; Fan,Y.-T. ; Chang,C.-K.
Pub. info.: Microlithographic Techniques in IC Fabrication.  pp.186-195,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3183
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Conference Proceedings
Conference Proceedings
18. Impact testing of silicon-micromachined beams
Lee,C.-H. ; Kaajakari,V. ; Lal,A.
Pub. info.: Materials and Device Characterization in Micromachining II.  pp.80-86,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3875
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Conference Proceedings
Conference Proceedings
19. High-growth-rate epitaxy of InN film by a novel-design MOCVD
Yang,F.-H. ; Yang,Y.-J. ; Hwang,J.-H. ; Lee,C.-H. ; Chen,K.-H. ; Lin,C.-Y.
Pub. info.: Optoelectronic Materials and Devices II.  pp.500-506,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4078
20.

Conference Proceedings
Conference Proceedings
20. Passive optical network for CDMA personal communication system
Kim,H. ; Cheong,J.M. ; Lee,C.-H. ; Chyng,Y.C.
Pub. info.: Optical Fiber Communication.  pp.41-48,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3420
21.

Conference Proceedings
Conference Proceedings
21. Verifying and preventing recurrence in metal defects for VLSI manufacturing
Lin,H.-P. ; Lee,C.-H. ; Lo,Y.-C. ; Liao,C.-H. ; Lu,K. L.
Pub. info.: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing III.  pp.50-61,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3213
22.

Conference Proceedings
Conference Proceedings
22. Design and fabrication of optical thin film color splitting and combing components for projection display
Lee,C.-H. ; Shiau,S.-C. ; Tsai,R.-Y. ; Ho,F.-C.
Pub. info.: Projection Displays IV.  pp.246-254,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3296
23.

Conference Proceedings
Conference Proceedings
23. Miniature ultrasonic transducers with optical strain readout
Lee,C.-H. ; Lal,A.
Pub. info.: Miniaturized Systems with Micro-Optics and MEMS.  pp.238-244,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3878