1.

Conference Proceedings
Conference Proceedings
1. Effect of Poly-Si on Electromigration Behaviors and Microstructure Characteristics of Au Metallization
Lee, T. ; York, B. R. ; Lindgren, B. ; Kentzinger, H. ; Lee, J. ; Christenson, C. ; Varker, C. ; Evans, K.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.299-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516
2.

Conference Proceedings
Conference Proceedings
2. Microstructure Evolution of Al-1.5% Cu Alloy as a Function of Resistance Change Due to Isothermal DC Stressing
Lee, T. ; Schade, M. ; Merino, A. ; Lee, J. ; Christenson, C. ; Varker, C. ; Evans, K.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.109-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516