Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.994-997, 2006. Uetikon-Zuerich. Trans Tech Publications
Optical information processing technology : 16-18 October 2002, Shanghai, China. pp.334-341, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Coherence domain optical methods and optical coherence tomography in biomedicine VIII : 26-28 January 2004, San Jose, California, USA. pp.454-462, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Peterson, J. ; Barnett, J. ; Young, C. ; Hou, A. ; Gutt, J. ; Gopalan, S. ; Lee, C.H. ; Li, H.J. ; Moumen, N. ; Chaudhary, N. ; Lee, B.H. ; Bersuker, G. ; Zietzoff, P. ; Brown, G.A. ; Lysaght, P. ; Gardner, M. ; Murto, R.W. ; Huff, H.
Pub. info.:
Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium. pp.93-99, 2003. Pennington, NJ. Electrochemical Society
Ahn, T.-J. ; Kim, B.-H. ; Lee, B.H. ; Chung, Y. ; Paek, U.-C.T. ; Han, W.-T.
Pub. info.:
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optical fiber and planar waveguide technology : 13-15 November 2001, Beijing, Chaina. pp.154-161, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Polymer/metal interfaces and defect mediated phenomena in ordered polymers : symposia held December 2-6, 2002, Boston, Massachusetts, U.S.A.. pp.267-544, 2003. Warrendale, Pa.. Materials Research Society
Alshareef, H. ; Wen, H.-C. ; Choi, K. ; Harris, R. ; Lysaght, P. ; Luan, H. ; Majhi, P. ; Lee, B.H.
Pub. info.:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.198-206, 2005. Pennington, NJ. Electrochemical Society
Optical fiber and fiber component mechanical reliability and testing II : 21 January 2002, San Jose, USA. pp.110-117, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ANTEC '96 : Plastics-Racing into the Future, May 5-10, Indianapolis : conference proceedings. Vol. 1 pp.708-713, 1996. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Nieh, R. ; Qi, W-J. ; Lee, B.H. ; Kang, L. ; Jeon, Y. ; Onishi, K. ; Gopalan, S. ; Kang, C.S. ; Dhrarmarajan, E. ; Choi, R. ; Lee, J.C.
Pub. info.:
Low and high dielectric constant materials : materials science, processing, and reliability issues : proceedings of the fifth international symposium. pp.214-221, 2000. Pennington, N.J.. Electrochemical Society
ANTEC '96 : Plastics-Racing into the Future, May 5-10, Indianapolis : conference proceedings. Vol. 1 pp.692-698, 1996. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Kim, B.H. ; Ahn, T.-J. ; Park, Y. ; Kim, D.Y. ; Lee, B.H. ; Chung, Y. ; Paek, U.-C.T. ; Han, W.-T.
Pub. info.:
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optical fiber and planar waveguide technology : 13-15 November 2001, Beijing, Chaina. pp.286-295, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Algorithms and systems for optical information processing VI : 8-10 July, 2002, Seattle, Washington, USA. pp.213-223, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Algorithms and systems for optical information processing VI : 8-10 July, 2002, Seattle, Washington, USA. pp.36-43, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Algorithms and systems for optical information processing VI : 8-10 July, 2002, Seattle, Washington, USA. pp.1-9, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bersuker, G. ; Sim, J.H. ; Young, C.D. ; Choi, R. ; Lee, B.H. ; Lysaght, P. ; Brown, G.A. ; Zeitzoff, P.M. ; Gardner, M. ; Murto, R.W. ; Huff, H.R.
Pub. info.:
Integration of advanced micro- and nanoelectronic devices - critical issues and solutions : symposium held April 13-16, 2004, San Francisco, California, U.S.A.. pp.31-36, 2004. Warrendale, Pa.. Materials Research Society
Optical information processing technology : 16-18 October 2002, Shanghai, China. pp.49-58, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Choi, E.S. ; Kim, Y.-J. ; Kim, M.J. ; Lee, C. ; Lee, B.H.
Pub. info.:
Coherence domain optical methods and optical coherence tomography in biomedicine VII : 27-29 January 2003, San Jose, California, USA. pp.154-162, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Barnett, Joel ; Moumen, N. ; Gutt, J. ; Gardner, M. ; Huffman, C. ; Majhi, P. ; Peterson, J.J. ; Gopalan, S. ; Foran, B. ; Li, H.-J. ; Lee, B.H. ; Bersuker, G. ; Zeitzoff, P.M. ; Brown, G.A. ; Lysaght, P. ; Young, C. ; Murto, R.W. ; Huff, H.R.
Pub. info.:
Integration of advanced micro- and nanoelectronic devices - critical issues and solutions : symposium held April 13-16, 2004, San Francisco, California, U.S.A.. pp.841-846, 2004. Warrendale, Pa.. Materials Research Society
Eom, J.B. ; Park, K.W. ; Chung, Y. ; Han, W.-T. ; Paek, U.-C.T. ; Kim, D.Y. ; Lee, B.H.
Pub. info.:
Photonic bandgap materials and devices : 23-25 January, 2002, San Jose, USA. pp.124-131, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Song, S.C. ; Bersuker, G. ; Zhang, Z. ; Lee, B.H. ; Huffman, C. ; Bae, S.H. ; Sim, J.H. ; Kirsch, P. ; Majhi, P. ; Moumen, N, ; Ramiller, C.
Pub. info.:
Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium. pp.456-470, 2005. Pennington, N.J.. Electrochemical Society
Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003. pp.1221-1224, 2004. Zuerich. Trans Tech Publications
Han, S.H. ; Park, J.H. ; Kim, H. ; Yang, B.C. ; Paek, J.W. ; Lee, B.H.
Pub. info.:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VIII. pp.277-284, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VIII. pp.252-260, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VIII. pp.220-230, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.859-864, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, B.H. ; Chin, S.-B. ; Cho, D.H. ; Song, C.-L. ; Yeo, J.-H. ; Some, D. ; Reinhorn, S.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.849-858, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering