Lagowski, J. ; Hoff, A. ; Jastrzebski, L. ; Edelman, P. ; Esry, T.
Pub. info.:
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.437-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Edelman, P. ; Lagowski, J. ; Savchouk, A. ; Hoff, A. ; Jastrzebski, L. ; Persson, E.
Pub. info.:
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.443-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Wilson, M. ; Lagowski, J. ; Savtchou, A. ; Marinskiy, D. ; Jastrzebski, L. ; D'Amico, J.
Pub. info.:
Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.345-, 2000. Warrendale, PA. MRS-Materials Research Society
Marinskiy, D. ; Lagowski, J. ; Wilson, M. ; Savtchouk, A. ; Jastrzebski, L. ; DeBusk, D.
Pub. info.:
Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.225-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Ostapenko, S. ; Henley, W. ; Karimpanakkel, S. ; Jastrzebski, L. ; Lagowski, J.
Pub. info.:
Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.. pp.405-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Ostapenko, S. ; Jastrzebski, L. ; Lagowski, J. ; Smeltzer, R. K.
Pub. info.:
Flat panel display materials II : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.201-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society