G.J. Xing ; H.J. Xu ; X.K. Li ; L. Chang ; X.N. Wu
Pub. info.:
Advanced Materials Science and Technology : Selected, peer reviewed papers from the 8th International Forum on Advanced Materials Science and Technology (IFAMST 8) August 1-4, 2012, Fukuoka Institute of Technology, Japan. pp.172-175, 2013. Aedermannsdorf, Switzerland. Trans Tech Publications
Scanning probe microscopies III : 6-7 February 1995, San Jose, California. pp.71-77, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Instrumentation Science and Technology. 1 pp.71330Y-1-71330Y-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China. pp.716038-1-716038-7, 2009. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering