Ohyama, H. ; Simoen, E. ; Claeys, C. ; Vanhellemont, J. ; Takami, Y. ; Hayama, T. ; Sunaga, H. ; Kobayashi, K.
Pub. info.:
Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II. pp.143-152, 1997. Pennington, NJ. Electrochemical Society
Hakata, T. ; Ohyama, H. ; Simoen, E. ; Claeys, C. ; Sunaga, H. ; Kobayashi, K. ; Hososhima, M.
Pub. info.:
Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.435-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Ohyama, H. ; Hakata, T. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Hayama, K. ; Tokuyama, J. ; Shigaki, K. ; Kobayashi, K. ; Sunaga, H. ; Miyahara, K. ; Hososhima, M.
Pub. info.:
Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.429-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Hayama, K. ; Hakata, T. ; Tokuyama, J. ; Kobayashi, K. ; Sunaga, H. ; Poortmans, J. ; Caymax, M.
Pub. info.:
Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.99-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Claeys, C. ; Ikegami, M. ; Kobayashi, K. ; Nakabayashi, M. ; Ohyama, H. ; Simoen, E. ; Sunaga, H. ; Takami, Y. ; Takizawa, H. ; Yoneoka, M.
Pub. info.:
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A29.3-, 2001. Warrendale. Materials Research Society
Poyai, A. ; Simoen, E. ; Claeys, C. ; Hayama, K. ; Kobayashi, K. ; Ohyama, H.
Pub. info.:
Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany. pp.93-102, 2001. Pennington, N.J.. Electrochemical Society