1.

Technical Paper

Technical Paper
Park, J. ; Kim, Y.
Pub. info.: A collection of technical papers : 1st International Energy Conversion Engineering Conference, Portsmouth, Virginia, 17-21 August 2003.  pp.420-426,  2003.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper
2.

Technical Paper

Technical Paper
Oh, S. ; Park, J. ; Lee, S. ; Yun, S. ; Lee, J. ; Kim, Y.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA International Communications Satellite Systems Conference
Ser. no.: 22nd
3.

Technical Paper

Technical Paper
Kim, Y. ; Bae, K. ; Byun, Y. ; Park, J. ; Lee, J.
Pub. info.: A collection of technical papers : 21st AIAA Applied Aerodynamics Conference, Orlando, Florida, 23-26 June 2003.  v. 3  pp.1889-1897,  2003.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Applied Aerodynamics Conference
Ser. no.: 2003
4.

Technical Paper

Technical Paper
Kim, Y. ; Park, J.
Pub. info.: 2011 SAE world congress : technical paper.  2011.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2011
5.

Technical Paper

Technical Paper
Kim, D. ; Lee, T. ; Kim, Y. ; Park, J.
Pub. info.: 2004 SAE world congress : technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
6.

Conference Proceedings

Conference Proceedings
Kim, J. ; Kim, Y. ; Park, J. ; Kang, J. ; Lee, B.
Pub. info.: Optical Information Systems IV.  pp.631105-631105,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6311
7.

Conference Proceedings

Conference Proceedings
Hong, J. ; Woo, C. ; Park, J. ; Cho, B. ; Choi, J.-S. ; Yang, H. ; Park, C. ; Shin, Y.-C. ; Kim, Y. ; Jeong, G. ; Kim, J. ; Kang, K. ; Kang, C. ; Yim, D. ; Song, Y.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.406-414,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038