Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA. pp.615608-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Cronin, J.P. ; Aruchamy, A. ; Rosenfelder, S. ; Kim, S.-J. ; Uhlmann, D.R. ; El-Bayoumi, O.H. ; Andrews, R.J.
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High-temperature superconductors : fundamental properties and novel materials processing : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A.. pp.321-324, 1990. Pittsburgh, Pa.. Materials Research Society
Bai, G. ; Nicolet, M-A. ; Kim, S.-J. ; Sobers, R.G. ; Lee, J.W. ; Brelvi, M. ; Thomas, P.M. ; Wilt, D.P.
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Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.171-182, 1990. Pittsburgh, Pa.. Materials Research Society
Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A.. pp.437-442, 1987. Pittsburgh, Pa.. Materials Research Society
Averback, R.S. ; Kim, S.-J. ; Diaz de la Rubia, T.
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Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A.. pp.399-410, 1987. Pittsburgh, Pa.. Materials Research Society
BioMEMS and nanotechnology : 10-12 December 2003, Perth, Australia. pp.317-324, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Seo, D.-H. ; Shin, C.-M. ; Kim, J.-Y. ; Kim, C.-S. ; Kim, J.-W. ; Kim, S.-J.
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Optical pattern recognition XIII : 2 April, 2002, Orlando, USA. pp.82-89, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Murthy, S. ; Kim, S.-J. ; Jung, T. ; Wang, Z. ; Hsin, W. ; Wu, M. C.
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Active and passive optical components for WDM communications III : 8-11 September, 2003, Orlando, Florida, USA. pp.491-500, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Park, K.K. ; Oh, S.T. ; Baeck, S.M. ; Kim, D.-I. ; Han, J.H. ; Han, H.N. ; Park, S.-H. ; Lee, C.G. ; Kim, S.-J. ; Oh, K.H.
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Textures of materials : ICOTOM 13 : proceedings of the 13th International Conference on Textures of Materials, Seoul, Korea, August 26-30, 2002. pp.571-576, 2002. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.237-244, 1985. Pittsburgh, Pa.. Materials Research Society
Advanced materials processing II : proceedings of the 2nd International Conference on Advanced Materials Processing, Grand Hyatt, Singapore, 2nd-4th December 2002. pp.89-92, 2003. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Lee, J.-W ; Kim, S.H. ; Park, Y.S. ; Shinn, M.N. ; Kang, D.H. ; Voon, S.Y ; Kim, D.S. ; Park, T.S. ; Ha, S.H. ; Lee, J.-H. ; Kim, S.-J.
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Proceedings of the Fourth International Symposium on Magnetic Materials, Processes, and Devices : applications to storage and microelectromechanical systems (MEMS). pp.91-102, 1995. Pennington, NJ. Electrochemical Society
Park, J.-M. ; Kim, S.-J. ; Jung, J.-G. ; Hansen, G. ; Yoon, D.-J.
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Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems. pp.61742U-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.541-549, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, D.-S. ; Chung, K.-H. ; Yang, H. ; Park, S. H. ; Kim, S.-J. ; Pyo, H.-B.
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Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II. pp.429-437, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering