Bae, T.M. ; Jin, S.H. ; Choo, J.H. ; Park, M. ; Ro, Y.M. ; Kim, H.-R. ; Kang, K.
Pub. info.:
Internet imaging V : 19-20 January 2004, San Jose, California, USA. pp.214-223, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fukada, T. ; Yoo, W.S. ; Hiraga, Y. ; Kang, K. ; Kitayama, H.
Pub. info.:
Rapid thermal and other short-time processing technologies II : proceedings of the international symposium. pp.113-120, 2001. Pennington, NJ. Electrochemical Society
Yoo, W.S. ; Fukada, T. ; Hiraga, Y. ; Kang, K. ; Yamamoto, J.
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Rapid thermal and other short-time processing technologies II : proceedings of the international symposium. pp.401-408, 2001. Pennington, NJ. Electrochemical Society
Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium. pp.3-10, 2004. Pennington, NJ. Electrochemical Society
Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.514-521, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium. pp.111-118, 2003. Pennington, NJ. Electrochemical Society
Yoshimoto, M. ; Nishigaki, H. ; Harima, H. ; Kang, K. ; Yoo, W. S.
Pub. info.:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.50-57, 2005. Pennington, NJ. Electrochemical Society
Suzuki, T. ; Seto, M. ; Suzuki, N. ; Kang, K. ; Yoo, W. S.
Pub. info.:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.68-75, 2005. Pennington, NJ. Electrochemical Society
Harnish, J. ; Carlson, C. ; Foggiato, J. ; Kang, K. ; Yoo, W. S.
Pub. info.:
Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium. pp.25-32, 2005. Pennington, NJ. Electrochemical Society
Carlier, D. ; Kang, K. ; Ceder, G. ; Yoon, W.-S. ; Grey, C.P.
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New trends in intercalation compounds for energy storage and conversion : proceedings of the international symposium. pp.375-382, 2003. Pennington, N.J.. Electrochemical Society
Cudell, J.R. ; Martynov, E. ; Kang, K. ; Ezhela, V.V. ; Kuyanov, Yu.V. ; Lugovsky, S.B. ; Razuvaev, E.A. ; Tkachenko, N.P. ; Gauron, P. ; Nicolescu, B.
Pub. info.:
Diffraction 2002 : interpretation of the new diffractive phenomena in quantum chromodynamics and in the S-matrix theory. pp.63-72, 2003. Dordrecht. Kluwer Academic Publishers
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ezhela, V.V. ; Kuyanov, Yu.V. ; Lugovsky, K.S. ; Lugovsky, V.S. ; Razuvaev, E.A. ; Sapunov, M.Yu. ; Tkachenko, N.P. ; Zenin, O.V. ; Kang, K. ; Whalley, M.R. ; Lengyel, A. ; Kang, S.K. ; Cudell, J.R. ; Martynov, E. ; Selyugin, O. ; Gauron, P. ; Nicolescu, B.
Pub. info.:
Diffraction 2002 : interpretation of the new diffractive phenomena in quantum chromodynamics and in the S-matrix theory. pp.47-62, 2003. Dordrecht. Kluwer Academic Publishers
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.765-774, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2002 : modeling, signal processing, and control : 18-21 March 2002, San Diego, USA. pp.214-221, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Optical Storage (ISOS 2002). pp.107-110, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hong, J. ; Woo, C. ; Park, J. ; Cho, B. ; Choi, J.-S. ; Yang, H. ; Park, C. ; Shin, Y.-C. ; Kim, Y. ; Jeong, G. ; Kim, J. ; Kang, K. ; Kang, C. ; Yim, D. ; Song, Y.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.406-414, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering