1.

Conference Proceedings
Conference Proceedings
1. Challenge for effective OCV control in 90-nm logic gate using ArF lithography
Kang, H.-J. ; Lee, S.-W. ; Lee, D.-Y. ; Yeo, G.-S. ; Lee, J.-H. ; Cho, H.-K. ; Han, W.-S. ; Moon, J.-T.
Pub. info.: Optical Microlithography XVI.  Part Two  pp.1194-1201,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040
2.

Conference Proceedings
Conference Proceedings
2. Investigation on the reliability of holey fiber in telecommunication field application [6351-169]
Kim, G. H. ; Cho, H. S. ; Han, Y.-G. ; Lee, J. H. ; Kim. S. H. ; Lee, S. B. ; Lee, K. S. ; Lee, S. W. ; Choi, S. S. ; Jung, C. H. ; Koo, S. S. ; Lee, K.-G. ; Park, H. Y. ; Ouh, C.-H. ; Ryu, K.-S. ; Kang, H.-J.
Pub. info.: Passive Components and Fiber-based Devices III.  pp.635148-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6351