1.

Conference Proceedings
Conference Proceedings
1. Resistance Change Caused by Electrochemically Induced Carrier Injection in NiO Films.
T. Yoda ; K. Kinoshita ; T. Fukuhara ; S. Kishida ; N. Sawai ; K. Honda
Pub. info.: Functional metal oxide nanostructures : symposium held November 28-December 2 2011, Boston, Massachusetts, USA.  pp.63-68,  2012.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1406
2.

Conference Proceedings
Conference Proceedings
2. Memory Retention Characteristics of Data Storage Area Written in Transition Metal Oxide Films by Using Atomic Force Microscope.
K. Kinoshita ; T. Yoda ; S. Kishida
Pub. info.: New functional materials and emerging device architectures for nonvolatile memories : symposium held April 25-29, 2011, San Francisco, California, U.S.A..  pp.85-90,  2011.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1337
3.

Conference Proceedings
Conference Proceedings
3. Analysis on Resistance Change Mechanism of NiO-ReRAM Using Visualization Technique of Data Storage Area with Secondary Electron Image
K. Kinoshita ; T. Makino ; T. Yoda ; K. Dobashi ; S. Kishida
Pub. info.: Materials and physics for nonvolatile memories II : spring 2010, April 5-9, San Francisco, California, U.S.A..  pp.227-232,  2010.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1250