1.

Conference Proceedings
Conference Proceedings
1. Standardization of Characterization of Bulk Microdefects and Denuded Zones in Annealed CZ Si
R. Takeda ; N. Inoue ; K. Moriya ; K. Kashima ; K. Nakashima ; M. Kato ; S. Kitagawa ; T. Ono ; H. Urushido ; N. Nango ; V. Akhmetov
Pub. info.: Silicon materials science and technology X.  pp.471-484,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(2)
2.

Conference Proceedings
Conference Proceedings
2. Standardization of Measurement of Nitrogen Concentration in CZ Silicon Crystals
N. Inoue ; A. Karen ; H. Yagi ; K. Masumoto ; M. Shinomiya ; K. Kashima ; K. Eifuku ; M. Koizumi ; T. Takahashi ; T. Takenawa ; K. Shingu
Pub. info.: Silicon materials science and technology X.  pp.453-460,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(2)