1.

Conference Proceedings
Conference Proceedings
1. Defects eliminated by hydrogen and boron ion bombardment in polycrystalline diamond films
Xia,Y. ; Sekiguchi,T. ; Shi,W. ; Wang,L. ; Ju,J. ; Yao,T.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.560-564,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
2.

Conference Proceedings
Conference Proceedings
2. Microstructure and infrared optical properties of hydrogenated carbon nitride film
Ju,J. ; Xia,Y. ; Zhang,W. ; Wang,L. ; Shi,W. ; Huang,Z. ; Li,Z.-F. ; Zeng,G. ; Tang,D.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.570-573,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
3.

Conference Proceedings
Conference Proceedings
3. Diamond film: a promising passivation film of porous silicon
Shi,W. ; Wang,L. ; Xia,Y. ; Ju,J. ; Fang,Z. ; Mo,Y.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.556-559,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
4.

Conference Proceedings
Conference Proceedings
4. Textured growth of [100] diamond on Al2O3 ceramic substrate by microwave plasma chemical vapor deposition
Fang,Z. ; Xia,Y. ; Ju,J. ; Wang,L. ; Zhang,W.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.595-598,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086