1.

Conference Proceedings
Conference Proceedings
1. Excess Carrier Lifetime and Surface Recombination Velocity in Dielectrically Isolated SI-Tubs
Meynants, G. ; Poortmans, J. ; Mertens, R. ; Jones, S. ; Polce, N. ; Blackstone, S.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.257-263,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
2.

Conference Proceedings
Conference Proceedings
2. HVIC Process on Bonded Wafers with Internal Gettering
Polce, N. ; Calley, M. ; Jones, S. ; Blackstone, S. ; Martin, P.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.470-472,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-35