1.

Conference Proceedings
Conference Proceedings
1. Study of the Dislocation Atmospheres in n-Type GaAs by DSL Photoetching,EBIC and Microraman Measurements
Martin,P. ; Jimenez,J. ; Frigeri,C. ; Weyher,J. ; Sonnenberg,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1791-1796,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Homogencity of Fe-doped InP wafers using optical microprobes
Sanz,L.F. ; Gonzalez,M.A. ; Avella,M. ; Alvarez,A. ; Jimenez,J. ; Fornari,R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.825-830,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Creep Transients in YBa2Cu3O7-x Superconductors
Jimenez,J. ; Garcia,F. ; Jimenez-Melendo,M. ; Dominguez-Rodriguez,A.
Pub. info.: Proceedings of the 13th International Conference on Defects in Insulating Materials, ICDIM 96, July 15-19, 1996, Wake Forest University, Winston-Salem, NC 27109, USA.  pp.439-442,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 239-241