1.

Conference Proceedings
Conference Proceedings
1. Characterization of the Subthreshold Damage in MeV Ion-Implanted p Si
Fatima, S. ; Wong-Leung, J. ; Gerald, J. Fitz ; Jagadish, C.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.411-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
2.

Conference Proceedings
Conference Proceedings
2. Ion Implantation Processing and Related Effects in SiC
Svensson, B.G. ; Hallen, A. ; Wong-Leung, J. ; Janson, M.S. ; Linnarsson, M.K. ; Kuznetsov, A.Yu. ; Alfieri, G. ; Grossner, U. ; Monakhov, E.V. ; Nielsen, H.K. ; Jagadish, C. ; Grillenberger, J.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.781-786,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529