1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF GaAs AND Ge FILMS ON (100) SILICON
Baribeau, J. _M. ; Houghton, D. C. ; Maigne, P. ; Moore, W. T. ; Devine, R. L. S. ; Denhoff, M. W. ; Stoner, R. J. ; McCaffrey, J. ; Jackman, T. E.
Pub. info.: Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.175-180,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 91
2.

Conference Proceedings
Conference Proceedings
2. CHARACTERIZATION OF Si MBE LAYERS DOPED IN SITU BY As ION BEAMS
Swanson, Max L. ; Parikh, N. R. ; Jackman, T. E. ; Houghton, D. C. ; Denhoff, M. W.
Pub. info.: Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.249-252,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 102