1.

Conference Proceedings
Conference Proceedings
1. New Method for Identifying Yield Impacting Polishing Induced Defects (PID) on Polished Silicon Substrates
K. Kim ; B. Moon ; H.S. Suh ; J. Kim ; S. Venkat
Pub. info.: High Purity Silicon 10.  pp.321-329,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(6)
2.

Conference Proceedings
Conference Proceedings
2. Failure Mechanism by Organic Contaminants in Si Device Fabrication
K. Kim ; J. Kim ; K. Lee ; H. Kang ; B. Lee
Pub. info.: High Purity Silicon 10.  pp.227-236,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(6)
3.

Conference Proceedings
Conference Proceedings
3. Silver Direct Electrodeposition on Ru Thin Film
H. Koo ; J. Kim ; K. Kim
Pub. info.: Electrochemical Processing in ULSI and MEMS 2.  pp.209-216,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(6)
4.

Conference Proceedings
Conference Proceedings
4. Characteristic of Junction Leakage Current with Bulk Micro Defect Density in p-n+ Junctions
W. Lee ; J. Kim ; K. Kim ; K. Lee ; D. Hwang
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes 7.  pp.219-222,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(3)
5.

Conference Proceedings
Conference Proceedings
5. Plasma Etching for the Application to Low-K Dielectrics Devices
J.W. Lee ; H.W. Kim ; J.W. Han ; M.S. Kim ; B.D. Yoo ; M.H. Kim ; C.H. Lee ; C.H. Lim ; S.K. Hwang ; C. Lee ; D.J. Chung ; S.G. Park ; S.G. Lee ; B.H. O ; J. Kim ; S.P. Chang ; S.H. Lee ; S.Y. Chai ; W.I. Lee ; S.E. Park ; K. Kim ; D.K. Choi ; C.W. Chung
Pub. info.: Research trends in contemporary materials science : YUCOMAT VIII : selected papers presented at the 8th Conference of the Yugoslav Materials Research Society, held in Herceg Novi, Montenegro September 4-8, 2006.  pp.113-118,  2007.  Stafa-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 555
6.

Conference Proceedings
Conference Proceedings
6. An Easy Method to Measure the Damaged Thickness of Low-k Film after Ash Process
C. Shim ; H. Lim ; S. Jung ; I. Shin ; K. Park ; J. Whang ; H. Lee ; J. Kim ; J. Han ; K. Kim
Pub. info.: Dielectrics for nanosystems II: materials science, processing, reliability, and manufacturing.  pp.243-254,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(1)
7.

Conference Proceedings
Conference Proceedings
7. Macropore Formation in p-type Silicon and Si/SiGe/Si/SiGe/p-type Silicon
J. Kim ; H. Seo ; K. Kim ; H. Lyu ; S. Woo
Pub. info.: Porous semiconductors : a symposium held in memory of Vitali Parkhutik and Volker Lehmann.  pp.277-283,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(3)
8.

Conference Proceedings
Conference Proceedings
8. Macropore Formation in Prepatterned p-type Silicon
J. Kim ; K. Kim ; H. Seo ; H. Lyu ; S. Woo
Pub. info.: Porous semiconductors : a symposium held in memory of Vitali Parkhutik and Volker Lehmann.  pp.291-297,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(3)
9.

Technical Paper
Technical Paper
9. Computation of Segmented Arc-Heater Flows Considering Injection of Electrode Shield Gas
J. Lee ; G. Jeong ; J. Kim ; K. Kim
Pub. info.: AIAA meeting papers on disc.  2009.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 2009
10.

Technical Paper
Technical Paper
10. Study on the Effect of Aligned Cellulose Film to the Performance of Electro-Active Paper Actuator
G. Yun ; H. Kim ; J. Kim ; K. Kim ; C. Yang
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.: 2007