1.

Conference Proceedings
Conference Proceedings
1. Confocal photoluminescense microscopy in ?-? materials:annealing and degradation dynamics
McCabe,E.M. ; Jordan,C. ; Fewer,D.T. ; Donegan,J.F. ; Taniguchi,S. ; Hino,T. ; Nakano,K. ; Ishibashi,A. ; Uusimaa,P. ; Pessa,M.
Pub. info.: Proceedings of three-dimensional and multidimensional microscopy : image acquisition and processing VI : 24-25 January 1999, San Jose, California.  pp.65-72,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3605
2.

Conference Proceedings
Conference Proceedings
2. Structural Study of Degraded II-VI Blue-Light Emitters
Tomiya,S. ; Ukita,M. ; Okuyama,H. ; Nakano,K. ; Itoh,S. ; Ishibashi,A. ; Morita,E. ; Ikeda,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1109-1116,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings
Conference Proceedings
3. Degradation of II-VI laser diodes.(Invited)
Nakano,K. ; Ishibashi,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1329-1334,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings
Conference Proceedings
4. Degradation physics of II-VI blue-green laser diodes and LEDs (Invited Paper)
Chuang,S.L. ; Ishibashi,A. ; Nakayama,N. ; Taniguchi,S. ; Nakano,K.
Pub. info.: Physics and Simulation of Optoelectronic Devices VI.  Part 1  pp.69-78,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3283
5.

Conference Proceedings
Conference Proceedings
5. Deep defect center characteristics of wide-bandgap II-VI and III-V blue laser materials(Invited Paper)
Ando,K. ; Yamaguchi,T. ; Koizumi,K. ; Okuno,Y. ; Abe,T. ; Kasada,H. ; Ishibashi,A. ; Nakano,K. ; Nakamura,S.
Pub. info.: Physics and Simulation of Optoelectronic Devices VI.  Part 1  pp.60-68,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3283