Job, R. ; Ulyashin, A.G. ; Huang, Y.L. ; Fahrner, W.R. ; Simoen, E. ; Claeys, C. ; Niedernostheide, F.-J. ; Schulze, H.-J. ; Tonelli, G.
Pub. info.:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.257-262, 2002. Warrendale, Pa. Materials Research Society
Dungen, W. ; Job, R. ; Ma, Y. ; Huang, Y.L. ; Fahrner, W.R. ; Keller, L.O. ; Horstmann, J.T.
Pub. info.:
Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.503-508, 2005. Warrendale, Pa.. Materials Research Society
Job, R. ; Dungen, W. ; Ma, Y. ; Huang, Y.L. ; Horstmann, J.T.
Pub. info.:
Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.487-492, 2005. Warrendale, Pa.. Materials Research Society
Huang, Y.L. ; Simoen, E. ; Job, R. ; Claeys, C. ; Dungen, W. ; Ma, Y. ; Fahrner, W.R. ; Versluys, J. ; Clauws, P.
Pub. info.:
Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.307-312, 2005. Warrendale, Pa.. Materials Research Society