1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF DEFECT STRUCTURES IN LELY 6H-SiC SINGLE CRYSTALS USING SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY
Huang, W. ; Wang, S. ; Dudley, M. ; Neudeck, P. ; Powell, J. A. ; Fazi, C.
Pub. info.: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.313-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 375
2.

Conference Proceedings
Conference Proceedings
2. COMPUTER AIDED SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHIC ANALYSIS OF MULTIPOLYTYPE SiC DEVICE CONFIGURATIONS
Huang, W. ; Wang, S. ; Dudley, M. ; Neudeck, P. ; Powell, J. A. ; Fazi, C.
Pub. info.: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.327-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 375
3.

Conference Proceedings
Conference Proceedings
3. Synchrotron White Beam X-Ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet
Vetter, W. M. ; Dudley, M. ; Huang, W. ; Neudeck, P. ; Powell, J. A.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.469-472,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
4.

Conference Proceedings
Conference Proceedings
4. Synchrotron White Beam Topography Studies of 2H SiC Crystals
Dudley, M. ; Huang, W. ; Vetter, W. M. ; Neudeck, P. ; Powell, J. A.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.465-468,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)