1.

Conference Proceedings

Conference Proceedings
Pearton,S.J. ; Abernathy,C.R. ; Hobson,W.S. ; Chakrabarti,U.K. ; Lopata,J. ; Kozuch,D.M. ; Stavola,M.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.617-622,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Dutta,N.K. ; Hobson,W.S. ; Vakhshoori,D. ; Lopata,J. ; Zydzik,G.J.
Pub. info.: Fabrication, testing, and reliability of semiconductor lasers II : 13-14 February, 1997, San Jose, California.  pp.22-33,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3004