1.

Conference Proceedings

Conference Proceedings
Bayer, M. ; Stern, O. ; Forchel, A. ; Hawrylak, P. ; Fafard, S. ; Hinzer, K. ; Narvaez, G. ; Wasilewski, Z.
Pub. info.: Semiconductor quantum dots II : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 642
2.

Conference Proceedings

Conference Proceedings
Bayer, M. ; Ortner, G. ; Larionov, A. ; Kress, A. ; Forchel, A.W.B. ; Hawrylak, P. ; Hinzer, K. ; Korkusinski, M. ; Fafard, S. ; Wasilewski, Z.R. ; Reinecke, T.L. ; Lyanda-Geller, Yu.
Pub. info.: 10th International Symposium on Nanostructures: Physics and Technology.  pp.522-525,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5023
3.

Conference Proceedings

Conference Proceedings
Borri, P. ; Langbein, W. ; Schneider, S. ; Woggon, U. ; Schwab, M. ; Bayer, M. ; Sellin, R.L. ; Ouyang, D. ; Bimberg, D. ; Fafard, S. ; Wasilewski, Z. ; Hawrylak, P.
Pub. info.: Quantum Dots, Nanoparticles, and Nanoclusters.  pp.96-107,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5361