1.

Conference Proceedings
Conference Proceedings
1. Monitoring GOES Imager visible-channel responsivities using emphirical distribution functions of Earth data [5882-26]
Crosby, D. ; Baucom, J. ; Chang, I.-L. ; Dean, C. ; Han, D. ; McMilIin, L. ; Weinreb, M. ; Wu, X.
Pub. info.: Earth observing systems X : 31 July-1 August 2005, San Diego, California, USA.  pp.58820O-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5882
2.

Conference Proceedings
Conference Proceedings
2. Improvements in the star-based monitoring of GOES Imager visible-channel responsivities [5882-24]
Chang, I. ; Dean, C. ; Han, D. ; Crosby, D. ; Weinreb, M. ; Baucom, J. ; Baltimore, P. ; Wu, X.
Pub. info.: Earth observing systems X : 31 July-1 August 2005, San Diego, California, USA.  pp.58820M-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5882
3.

Conference Proceedings
Conference Proceedings
3. Mitigation of anomalies in operational calibration of GOES-10 and -12 imagers and sounders [5882-50]
Han, D. ; Weinreb, M.
Pub. info.: Earth observing systems X : 31 July-1 August 2005, San Diego, California, USA.  pp.58821C-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5882
4.

Conference Proceedings
Conference Proceedings
4. Data selection criteria in star-based monitoring of GOES imager visible-channel responsivities
Chang, I-L. ; Crosby, D. ; Dean, C. ; Weinreb, M. ; Baltimore, P. ; Baucom, J. ; Han, D.
Pub. info.: Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA.  pp.253-261,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5546
5.

Conference Proceedings
Conference Proceedings
5. Best source for GOES imager scan-mirror emissivity data [6296-27]
Han, D. ; Weinreb, M.
Pub. info.: Earth Observing Systems XI.  pp.62960O-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6296