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Conference Proceedings

1. Index of refraction and its temperature dependence of calcium fluoride near 157 nm

Burnett,J.H. ; Gupta,R. ; Griesmann,U. ; Jou,T.E.

Pub. info.:	Optical microlithography XII : 17-19 March 1999, Santa Clara, California. Part2 pp.1146-1152, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3679

Conference Proceedings

2. Absolute index of refraction and its temperature dependence of calcium fluoride,barium fluoride,and strontium fluoride near 157 nm

Burnett,J.H. ; Gupta,R. ; Griesmann,U.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part2 pp.1503-1509, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000