1.

Conference Proceedings

Conference Proceedings
Baltagi, Y. ; Bru, C. ; Benyattou, T. ; Gracia-Perez, M. A. ; Guillot, G. ; Gendry, M. ; Leclercq, J. L. ; Drouot, V. ; Hollinger, G.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.199-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
2.

Conference Proceedings

Conference Proceedings
Salem, B. ; Benyattou, T. ; Guillot, G. ; Bremond, G. ; Brault, J. ; Gendry, M.
Pub. info.: Quantum confined semiconductor nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.77-172,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 737
3.

Conference Proceedings

Conference Proceedings
Salem, B. ; Guillot, G. ; Benyattou, T. ; Bru-Chevallier, C. ; Bremond, G. ; Monat, C. ; Gendry, M. ; Jbeli, A. ; Marie, X. ; Amand, T.
Pub. info.: Quantum Dots, Nanoparticles, and Nanoclusters II.  pp.27-30,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5734