Sirutkaitis, V. ; Eckardt, R.C. ; Balachninaite, O. ; Grigonis, R. ; Melninkaitis, A. ; Rakickas, T.
Pub. info.:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA. pp.19-34, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nickel, D. ; Fleig, C. ; Erhard, A. ; Letsch, A. ; Giesen, A. ; Jupe, M. ; Starke, K. ; Ristau, D. ; Wilhelm, O. ; Huber, R.A. ; Haspel, R. ; Schuhmann, U. ; Scharfenorth, C. ; Eichler, H.J. ; Gliech, S. ; Duparre, A. ; Schulz-Grosser, M. ; Krasilnikova, A. ; Haise, A. ; Riede, W. ; Balachninaite, O. ; Grigonis, R. ; Sirutkaitis, V. ; Kazakevich, V.
Pub. info.:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.520-526, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Balachninaite, O. ; Eckardt, R.C. ; Grigonis, R. ; Peckus, M. ; Sirutkaitis, V.
Pub. info.:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.500-512, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sirutkaitis, V. ; Balachninaite, O. ; Atamalian, A. ; Grigonis, R. ; Eckardt, R.C.
Pub. info.:
ICONO 2001: Nonlinear Optical Phenomena and Nonlinear Dynamics of Optical Systems. pp.65-70, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Balachninaite, O. ; Barkauskas, M. ; Eckardt, R.C. ; Grigonis, R. ; Maciulevicius, M. ; Melninkaitis, A. ; Sirutkaitis, V.
Pub. info.:
ICONO 2001: Nonlinear Optical Phenomena and Nonlinear Dynamics of Optical Systems. pp.291-296, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering