1.

Conference Proceedings
Conference Proceedings
1. Optically Detected Cyclotron Resonance for Defect Characterization
Godlewski,M. ; Chen,W.M. ; Monemar,B.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1353-1358,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. Optically Detected Magnetic Resonance Studies of Bound Exciton Triplets for Complex Defects in GaP
Monemar,B. ; Chen,W.M. ; Godlewski,M.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.769-774,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41