Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA. pp.61-71, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.204-211, 1997. Pennington, NJ. Electrochemical Society
Sixth International Conference on Quality Control by Artificial Vision. pp.69-77, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kerekes, R.A. ; Goddard, J.S. ; Gleason, S.S. ; Paulus, M.J. ; Weisenberger, A.G. ; Smith, M.F. ; Welch, B.
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Sixth International Conference on Quality Control by Artificial Vision. pp.129-139, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering