1.

Conference Proceedings

Conference Proceedings
Bagraev,N.T. ; Gelhoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naser,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1683-1688,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Bagraev,N.T. ; Chaikina,E.I. ; Gelhoff,W. ; Klyachkin,L.E. ; Markov,I.I. ; Malyarenko,A.M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1607-1612,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263