1.
Conference Proceedings
Steinchen, W. ; Gan, Y. ; Kupfer, G. ; Mackel, P.
Pub. info.:
Sixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications : 22-25 June 2004, Ancona, Italy . pp.499-509, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5503
2.
Conference Proceedings
Steinchen, W. ; Gan, Y. ; Kupfer, G. ; Maeckel, P.
Pub. info.:
Optical Measurement Systems for Industrial Inspection III . pp.885-893, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5144
3.
Conference Proceedings
Steinchen, W. ; Gan, Y. ; Kupfer, G. ; Mackel, P.
Pub. info.:
Optical Metrology in Production Engineering . pp.738-748, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5457
4.
Conference Proceedings
Gan, Y. ; Kupfer, G. ; Steinchen, W.
Pub. info.:
Optical Measurement Systems for Industrial Inspection IV . pp.786-792, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5856
5.
Conference Proceedings
Gan, Y. ; Steinchen, W.
Pub. info.:
Interferometry XIII: Techniques and Analysis . pp.629208-629208, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6292