1.
Conference Proceedings
Walton, D. T. ; Frost, H. J. ; Thompson, C. V.
Pub. info.:
Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. . pp.219-224, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
225
2.
Conference Proceedings
Frost, H. J. ; Hayashi, Y. ; Thompson, C. V. ; Walton, D. T.
Pub. info.:
Mechanisms of thin film evolution . pp.485-, 1994. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
317
3.
Conference Proceedings
Frost, H. J. ; Hayashi, Y. ; Thompson, C. V. ; Walton, D. T.
Pub. info.:
Mechanisms of thin film evolution . pp.431-, 1994. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
317