1.

Conference Proceedings
Conference Proceedings
1. MSTAR: an absolute metrology system with submicrometer accuracy
Lay, O. P. ; Dubovitsky, S. ; Peters, R. D. ; Burger, J. ; Steier, W. H. ; Ahn, S. -W. ; Fetterman, H. R.
Pub. info.: New frontiers in stellar interferometry : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.1068-1078,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5491
2.

Conference Proceedings
Conference Proceedings
2. Polymer Electrooptic Waveguide Fabrication
Ziari, M. ; Chen, A. ; Kalluri, S. ; Steier, W. H. ; Shi, Y. ; Wang, W. ; Chen, D. ; Fetterman, H. R.
Pub. info.: Polymers for second-order nonlinear optics.  pp.420-,  1995.  Washington, D.C..  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 601
3.

Conference Proceedings
Conference Proceedings
3. Absolute distance measurement with the MSTAR sensor
Lay, O. P. ; Dubovitsky, S. ; Peters, R. D. ; Burger, J. ; Ahn, S.-W. ; Steier, W. H. ; Fetterman, H. R. ; Chang, Y.
Pub. info.: Recent Developments in Traceable Dimensional Measurements II.  pp.361-372,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5190