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Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.59640B-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Kang, Y. ; Li, X. ; Xu, Y. ; Tang, Y. ; Zhang, S. ; Xie, W. ; Gong, H. ; Fang, J.
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Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China. pp.78-85, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering