1.

Conference Proceedings

Conference Proceedings
Liu,B. ; Fan,J. ; Yang,L. ; Wang,Q.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.9-14,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
2.

Conference Proceedings

Conference Proceedings
Fan,J. ; Wang,Q. ; Zheng,X. ; Zhou,J.
Pub. info.: Computer-aided design and computer graphics : Fourth International Conference on Computer-Aided Design and Computer Graphics : 23-25 October, 1995, Wuhan, China.  pp.69-74,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2644