1.

Conference Proceedings
Conference Proceedings
1. Structural Characterization of Bulk AlN Single Crystals Grown from Self-Seeding and Seeding by SiC Substrates
Raghothamachar, B. ; Dalmau, R. ; Dudley, M. ; Schlesser, R. ; Zhuang, D. ; Herro, Z. ; Sitar, Z.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1521-1524,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Strain Relaxation in GaN/AlN Films Grown on Vicinal and On-Axis SiC Substrates
Bai, J. ; Huang, X. ; Raghothamachar, B. ; Dudley, M. ; Wagner, B. ; Davis, R.F. ; Wu, L. ; Zhu, Y.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1513-1516,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
3.

Conference Proceedings
Conference Proceedings
3. Crystal Growth of CdTe by Gradient Freeze in Universal Multizone Crystallizator (UMC)
Su, C.H. ; Lehoczky, S.L. ; Li, C. ; Raghothamachar, B. ; Dudley, M. ; Szoke, J. ; Barczy, P.
Pub. info.: Solidification and gravity IV : proceedings of the 4th International Conference on Solidification and Gravity, held in Miskolc-Lillafured, Hungary, September 6-9, 2004.  pp.117-124,  2006.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 508
4.

Conference Proceedings
Conference Proceedings
4. Comparison between Measurement Techniques Used for Determination of the Micropipe Density in SiC Substrates
Emorhokpor, E. ; Carlson, E. ; Wan, J. ; Weber, A. ; Basceri, C. ; Jenny, J.R. ; Sandhu, R. ; Oliver, J.D. ; Burkeen, F. ; Somanchi, A. ; Velidandla, V. ; Orazio, F. ; Blew, A. ; Goorsky, M.S. ; Dudley, M.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.443-446,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
5.

Conference Proceedings
Conference Proceedings
5. Simulation of Threading Edge Dislocation Images in X-Ray Topographs of Silicon Carbide Homo-Epilayers
Vetter, W.M. ; Tsuchida, H. ; Kamata, I. ; Dudley, M.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.411-414,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
6.

Conference Proceedings
Conference Proceedings
6. CHARACTERIZATION OF GROWTH DEFECTS IN ZnTe SINGLE CRYSTALS
Zhou, W. ; Wu, J. ; Dudley, M. ; Su, C.H. ; Volz, M.P. ; Gillies, D.C. ; Szofran, F.R. ; Lehoczky, S.L.
Pub. info.: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.203-208,  1994.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 299
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Conference Proceedings
Conference Proceedings
7. Growth and Surface Morphologies of 6H SiC Bulk and Epitaxial Crystals
Dhanaraj, G. ; Chen, Y. ; Dudley, M. ; Zhang, H.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.67-70,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
8.

Conference Proceedings
Conference Proceedings
8. Stress Evolution During the Early Stages of AlN Vapor Growth
Wu, B. ; Bai, J. ; Tassev,, V. L. ; Lal Nakarmi M. ; Sun, W. ; Huang, X. ; Dudley, M. ; Zhang, H. ; Bliss, D. F. ; Lin, J. ; Jiang, H. ; Yang, J. ; Asif Kahn, M.
Pub. info.: GaN, AlN, InN and related materials : symposium held November 28-December 2, 2005, Boston, Massachusetts, U.S.A..  pp.653-658,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 892
9.

Conference Proceedings
Conference Proceedings
9. The Effect of Aluminum Nitride-Silicon Carbide Alloy Buffer Layers on the Sublimation Growth of Alumimm Nitride on SiC (0001) Substrates
Gu, Z. ; Edgar, J.H. ; Raghothamachar, B. ; Dudley, M. ; Zhuang, D. ; Sitar, Z.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1497-1500,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
10.

Conference Proceedings
Conference Proceedings
10. Plastics Failure Due to Oxidative Degradation in Processing and Service
Ezrin, M. ; Zepke, A. ; Helwig, J. ; Lavigne, G. ; Dudley, M.
Pub. info.: ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida.  pp.3108-3112,  2000.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 46
11.

Conference Proceedings
Conference Proceedings
11. X-RAY TOPOGRAPHIC ANALYSIS OF STRAIN FIELDS ASSOCIATED WITH MICRON-SIZED GRATINGS ON Si(100) SURFACES
Jardine, A.P. ; Dudley, M. ; Tolis, G. ; Yao, G.-D. ; Durbin, S.M.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.533-538,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
12.

Conference Proceedings
Conference Proceedings
12. DETERMINATION OF 3-DIMENSION DEFECT STRUCTURES IN GALLIUM ARSENIDE EPILAYERS ON SILICON USING WHITE BEAM SYNCHROTRON RADIATION TOPOGRAPHY IN BOTH TRANSMISSION AND GRAZING BRAGG-LAUE GEOMETRY
Dudley, M. ; Yao, G.-D. ; Wu, J. ; Liu, H.Y. ; Kao, Y.C.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.469-474,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
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Conference Proceedings
Conference Proceedings
13. THE APPLICATION OF NEUTRON TOPOGRAPHY TO THE STUDY OF X-RAY SENSITIVE ORGANIC CRYSTALS - A POSSIBLE ALTERNATIVE TO X-RAY TOPOGRAPHY
Dudley, M.
Pub. info.: Neutron scattering for materials science : symposium held November 27-30, 1989, Boston, Massachusetts, U.S.A..  pp.55-60,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 166
14.

Conference Proceedings
Conference Proceedings
14. OPTIMIZATION OF MBE OF CdTe/CdTe: REFINEMENT IN STRUCTURAL QUALITY EVALUATION OF MBE GROWN (111) CdTe
Lee, M. B. ; Fanning, T. ; Marzio, Di D. ; Casagrande, L. G. ; Dudley, M.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.169-174,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
15.

Conference Proceedings
Conference Proceedings
15. A Simple Mapping Method for Elementary Screw Dislocations in Homoepitaxial SiC Layers
Ha, S. ; Vetter, W.M. ; Dudley, M. ; Skowronski, M.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.443-446,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
16.

Conference Proceedings
Conference Proceedings
16. Studies of Interface Demarcation and Structural Defects in Ga Doped Ge Single Crystals Using Synchrotron White Beam X-ray Topography
Chung, H. ; Raghothamachar, B. ; Zhou, W. ; Dudley, M. ; Gillies, D. C.
Pub. info.: Applications of synchrotron radiation techniques to materials science III : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.107-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 437
17.

Conference Proceedings
Conference Proceedings
17. Determination of Burgers Vector of Screw Dislocations in 6H-SiC Single Crystals by Synchrotron White Beam X-ray Topography
Si, W. ; Dudley, M. ; Carter, C. ; Glass, R. ; Tsvetkov, V.
Pub. info.: Applications of synchrotron radiation techniques to materials science III : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.129-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 437
18.

Conference Proceedings
Conference Proceedings
18. Dynamic In Situ Synchrotron X-ray Topographic Observations of Dislocations in Notched Ice Crystals
Hu, X. ; Baker, I. ; Dudley, M.
Pub. info.: Applications of synchrotron radiation techniques to materials science III : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.119-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 437
19.

Conference Proceedings
Conference Proceedings
19. USE OF SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY TO CHARACTERIZE IR DETECTOR MANUFACTURING PROCESSES
Dudley, M. ; Wu, Jun ; Larson, D. J., Jr. ; DiMarzio, D.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.457-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
20.

Conference Proceedings
Conference Proceedings
20. Nonmicropipe Dislocations in 4H-SiC Devices: Electrical Properties and Device Technology Implications
Neudeck, P. G. ; Huang, W. ; Dudley, M. ; Fazi, C.
Pub. info.: Wide-bandgap semiconductors for high power, high frequency, and high temperature : symposium held April 13-15, 1998, San Francisco, California, U.S.A..  pp.107-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 512
21.

Conference Proceedings
Conference Proceedings
21. Characterization of Micropipes and Other Defect Structures in 6H-SiC Through Fluorescence Microscopy
Vetter, W. M. ; Dudley, M. ; Wong, T-F. ; Fredrich, J. T.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.561-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
22.

Conference Proceedings
Conference Proceedings
22. CHARACTERIZATION OF DEFECT STRUCTURES IN LELY 6H-SiC SINGLE CRYSTALS USING SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY
Huang, W. ; Wang, S. ; Dudley, M. ; Neudeck, P. ; Powell, J. A. ; Fazi, C.
Pub. info.: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.313-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 375
23.

Conference Proceedings
Conference Proceedings
23. Synchrotron White Beam Topography Studies of Residual Stress in SiC Single Crystal Wafers With Epitaxial Thin Films
Huang, W. ; Wang, Q. ; Dudley, M. ; Chiang, F. P. ; Parsons, J. ; Fazi, C.
Pub. info.: Evolution of epitaxial structure and morphology : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.425-,  1996.  Pittsburgh, Pennsylvania.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 399
24.

Conference Proceedings
Conference Proceedings
24. COMPUTER AIDED SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHIC ANALYSIS OF MULTIPOLYTYPE SiC DEVICE CONFIGURATIONS
Huang, W. ; Wang, S. ; Dudley, M. ; Neudeck, P. ; Powell, J. A. ; Fazi, C.
Pub. info.: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.327-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 375
25.

Conference Proceedings
Conference Proceedings
25. SYNCHROTRON WHITE BEAM TOPOGRAPHY STUDIES OF SCREW DISLOCATIONS IN 6H-SiC SINGLE CRYSTALS
Wang, S. ; Dudley, M. ; Carter, C. H., Jr. ; Tsvetkov, V. F. ; Fazi, C.
Pub. info.: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.281-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 375
26.

Conference Proceedings
Conference Proceedings
26. Characterization of growth defects in ZnTe single Crystals
Zhou, W. ; Wu, J. ; Dudley, M. ; Su, C. H. ; Volz, M. P. ; Gillies, D. C. ; Szofran, F. R. ; Lehoczky, S. L.
Pub. info.: Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.451-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 302
27.

Conference Proceedings
Conference Proceedings
27. Breakdown Degradation Associated With Elementary Screw Dislocations in 4H-SiC p+n Junction Rectifiers
Neudeck, P. G. ; Huang, W. ; Dudley, M.
Pub. info.: Power semiconductor materials and devices : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.285-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 483
28.

Conference Proceedings
Conference Proceedings
28. Characterization of Single-Crystal 3C-SiC Epitaxial Layers on Si Substrates
Saddow, S. E. ; Okhusyen, M. E. ; Mazzola, M. S. ; Dudley, M. ; Huang, X. R. ; Huang, W. ; Su, H. ; Shamsuzzoha, M. ; Lo, Y. H.
Pub. info.: III-V and IV-IV materials and processing challenges for highly integrated microelectronics and optoelectronics : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.107-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 535
29.

Conference Proceedings
Conference Proceedings
29. Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs
Huang, X. R. ; Dudley, M. ; Vetter, W. M. ; Huang, W. ; Wang, S. ; Carter, C. H., Jr.
Pub. info.: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.71-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 524
30.

Conference Proceedings
Conference Proceedings
30. The Mechanism of Twinning in Zinc-Blende Structure Crystals: New Insights on Polarity Effects From a Study of Magnetic-Liquid-Encapsulated Czochralski Grown InP Single Crystals
Dudley, M. ; Raghothamachar, B. ; Guo, Y. ; Huang, X. R. ; Chung, H. ; Larson, D. J., Jr. ; Hurle, D. T. J. ; Bliss, D. F. ; Prasad, V. ; Huang, Z.
Pub. info.: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.65-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 524
31.

Conference Proceedings
Conference Proceedings
31. X-ray Topography of a Single Superscrew Dislocation in 6H-SiC Through All {100} Faces
Vetter, W. M. ; Dudley, M.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.661-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
32.

Conference Proceedings
Conference Proceedings
32. Dislocation motion around loaded notches in ice single crystals
Cullen, D. ; Hu, X. ; Baker, I. ; Dudley, M.
Pub. info.: Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.291-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 590
33.

Conference Proceedings
Conference Proceedings
33. Characterization of Defect Structures in 3C-SiC Single Crystals Using Synchrotron White Beam X-ray Topography
Huang, W. ; Dudley, M. ; Fazi, C.
Pub. info.: III-Nitride, SiC, and Diamond Materials for Electronic Devices : symposium held April, 1996, San Francisco, California, U.S.A..  pp.545-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 423
34.

Conference Proceedings
Conference Proceedings
34. Oxidation-Induced Crystallographic Transformation in Heavily N-Doped 4H-SiC Wafers
Skromme, B.J. ; Palle, K. ; Poweleit, C.D. ; Bryant, L.R. ; Vetter, W.M. ; Dudley, M. ; Moore, K. ; Gehoski, T.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.455-458,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
35.

Conference Proceedings
Conference Proceedings
35. Relationship of Basal Plane and Prismatic Stacking Faults in GaN to Low Temperature Photoluminescence Peaks at 〜3.4 eV and 〜3.2 eV
Bai, J. ; Dudley, M. ; Chen, L. ; Skromme, B. J. ; Hartlieb, P. J. ; Michaels, E. ; Kolis, J. W. ; Wagner, B. ; Davis, R. F. ; Chowdhury, U. ; Dupuis, R. D.
Pub. info.: GaN, AIN, InN and their alloys : symposium held November 29-December 3, 2004, Boston, Massachusetts, U.S.A..  pp.721-726,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 831
36.

Conference Proceedings
Conference Proceedings
36. Progress In The Preparation Of Aluminum Nitride Substrates From Bulk Crystals
Rojo, J.C. ; Schowalter, L.J. ; Slack, Glen ; Morgan, K. ; Barani, J. ; Schujman, S. ; Biswas, S. ; Raghothamachar, B. ; Dudley, M. ; Shur, M. ; Gaska, R. ; Johnson, N.M. ; Kneissl, M.
Pub. info.: Materials and devices for optoelectronics and microphotonics : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.5-14,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 722
37.

Conference Proceedings
Conference Proceedings
37. Effects of Structural Defects on Diode Properties in 4H-SiC
Skromme, B.J. ; Palle, K.C. ; Mikhov, M.K. ; Meidia, H. ; Mahajan, S. ; Huang, X.R. ; Vetter, W.M. ; Dudley, M. ; Moore, K. ; Smith, S. ; Gehoski, T.
Pub. info.: Silicon carbide 2002 -- materials, processing and devices : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A..  pp.181-186,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 742
38.

Conference Proceedings
Conference Proceedings
38. Polytype Identification and Mapping in Heteroepitaxial Growth of 3C on Atomically Flat 4H-SiC Mesas Using Synchrotron White-Beam X-Ray Topography
Dudley, M. ; Vetter, W.M. ; Huang, X.R. ; Neudeck, P.G. ; Powell, J.A.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.391-394,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
39.

Conference Proceedings
Conference Proceedings
39. Characterization and Mapping of Crystal Defects in Silicon Carbide
Emorhokpor, E. ; Kerr, T. ; Zwieback, I. ; Elkington, W. ; Dudley, M. ; Anderson, T. ; Chen, J.
Pub. info.: Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A..  pp.127-132,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 815
40.

Conference Proceedings
Conference Proceedings
40. Structural Characterization of SiC Epitaxial Layers Grown on Porous SiC Substrates
Saddow, S.E. ; Melnychuk, G. ; Mynbaeva, M. ; Nikitina, I. ; Vetter, W.M. ; Jin, L. ; Dudley, M. ; Shamsuzzoha, M. ; Dmitriev, V. ; Wood, C.E.C
Pub. info.: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 640
41.

Conference Proceedings
Conference Proceedings
41. The Effect of Surface Finish on the Dislocation Density in Sublimation Grown SiC Layers
Sanchez, E. K. ; Liu, J. ; Skowronski, M. ; Vetter, W. M. ; Dudley, M. ; Bertke, R. ; Mitchel, W.C.
Pub. info.: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 640
42.

Conference Proceedings
Conference Proceedings
42. Characterization of SiC Using Synchrotron White Beam X-Ray Topography
Dudley, M. ; Huang, X.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.431-436,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
43.

Conference Proceedings
Conference Proceedings
43. Correlation of EBIC and SWBXT Imaged Defects and Epilayer Growth Pits in 6H-SiC Schottky Diodes
Schnabel, C. M. ; Tabib-Azar, M. ; Neudeck, P. G. ; Bailey, S. G. ; Su, H. B. ; Dudley, M. ; Raffaelle, R. P.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.489-492,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
44.

Conference Proceedings
Conference Proceedings
44. X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers
Kuhr, T. A. ; Vetter, W. M. ; Dudley, M. ; Skowronski, M.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.473-476,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
45.

Conference Proceedings
Conference Proceedings
45. Structural Investigation on the Nature of Surface Defects Present in Silicon Carbide Wafers Containing Varying Amount of Micropipes
Shamsuzzoha, M. ; Saddow, S. E. ; Schattner, T. E. ; Jin, L. ; Dudley, M. ; Rendakova, S. V. ; Dmitriev, V. A.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.453-456,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
46.

Conference Proceedings
Conference Proceedings
46. Nondestructive Defect Characterization of SiC Epilayers and its Significance for SiC Device Research
Ma, X. ; Dudley, M. ; Sudarshan, T.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.601-604,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
47.

Conference Proceedings
Conference Proceedings
47. Porous SiC for HT Chemical Sensing Devices: an Assessment of its Thermal Stability
Bai, J. ; Dhanaraj, G. ; Gouma, P. ; Dudley, M. ; Mynbaeva, M.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.1479-1482,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
48.

Conference Proceedings
Conference Proceedings
48. Homoepitaxial 'Web Growth' of SiC to Terminate C-Axis Screw Dislocations and Enlarge Step-Free Surfaces
Neudeck, P.G. ; Powell, J.A. ; Trunek, A. ; Spry, D. ; Beheim, G.M. ; Benavage, E. ; Abel, P. ; Vetter, W.M. ; Dudley, M.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.251-254,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
49.

Conference Proceedings
Conference Proceedings
49. Growth of Defect-Free 3C-SiC on 4H- and 6H-SiC Mesas Using Step-Free Surface Heteroepitaxy
Neudeck, P.G. ; Powell, J.A. ; Trunek, A.J. ; Huang, X.R. ; Dudley, M.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.311-314,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
50.

Conference Proceedings
Conference Proceedings
50. Synchrotron White Beam X-Ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet
Vetter, W. M. ; Dudley, M. ; Huang, W. ; Neudeck, P. ; Powell, J. A.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.469-472,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)