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Conference Proceedings

1. The Recombination Statistics of the Visible Photoluminescence of Silicon Nanocrystals

Diener, J. ; Kovalev, D. I. ; Ganichev, S. D. ; Polisski, G. ; Koch, F.

Pub. info.:	Advances in microcrystalline and nanocrystalline semiconductors, 1996 : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.553-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	452

Conference Proceedings

2. The Oxidation Behavior of Silicon Nanocrystals in the Submonolayer Region

Diener, J. ; Ben-Chorin, M. ; Kovalev, D. I. ; Polisski, G. ; Koch, F.

Pub. info.:	Materials and devices for silicon-based optoelectronics : symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A.. pp.261-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	486

Conference Proceedings

3. Spatially nanostructured silicon for optical application (Invited Paper)

Diener, J. ; Kovalev, D.I. ; Kuenzner, N. ; Gross, E. ; Polisski, G. ; Koch, F. ; Timoshenko, V.Yu. ; Fujii, M.

Pub. info.:	Optical properties of nanocrystals : 9-11 July 2002, Seattle, Washington, USA. pp.56-66, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4808

Conference Proceedings

4. Spatially nanostructured silicon for optical applications (Invited Paper)

Kovalev, D.I. ; Diener, J. ; Kuenzner, N. ; Gross, E. ; Polisski, G. ; Koch, F. ; Timoshenko, V.Yu. ; Fujii, M.

Pub. info.:	Sixth International Conference on Material Science and Material Properties for Infrared Optoelectronics. pp.12-22, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5065