1.

Conference Proceedings
Conference Proceedings
1. Two-dimensional wavelet mapping techniques for damage detection in structural systems
Amizic, B. ; Amaravadi, V.K. ; Rao, V.S. ; Derriso, M.M.
Pub. info.: Smart structures and materials 2002 : modeling, signal processing, and control : 18-21 March 2002, San Diego, USA.  pp.267-278,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4693
2.

Conference Proceedings
Conference Proceedings
2. Active control of smart structures with optimal actuator and sensor locations
Liu, P. ; Rao, V.S. ; Derriso, M.M.
Pub. info.: Smart structures and materials 2002 : modeling, signal processing, and control : 18-21 March 2002, San Diego, USA.  pp.1-12,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4693
3.

Conference Proceedings
Conference Proceedings
3. Self-organizing wireless sensor networks for structural health monitoring
Basheer, M.R. ; Rao, V.S. ; Derriso, M.M.
Pub. info.: Smart structures and materials 2003 : Modeling, signal processing, and control :3-6 March 2003, San Diego, California, USA, Ralph C. Smith, chairs/editors ; Sponsored by SPIE--The International Society for Optical Engineering.  pp.515-525,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5049
4.

Conference Proceedings
Conference Proceedings
4. Structural integrity monitoring of composite patch repairs using wavelet analysis and neural networks
Amaravadi, V.K. ; Mitchell, K. ; Rao, V.S. ; Derriso, M.M.
Pub. info.: Smart structures and materials 2002 : smart structures and integrated systems : 18-21 March 2002, San Diego, USA.  pp.156-166,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4701