1.

Conference Proceedings
Conference Proceedings
1. Investigation of surface ecological environment by remote sensing in semi-arid and arid regions in the north of Shaanxi Province
Liu, A. ; Li, D. ; Deng, F. ; Zhang, J. ; Dai, J. ; Zhuo, J.
Pub. info.: Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land.  Part Two  pp.707-715,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4890
2.

Conference Proceedings
Conference Proceedings
2. Dynamic supervising methods in the north part of Shaanxi province
Zhuo, J. ; Liu, A. ; Li, D. ; Deng, F. ; Zhang, J.
Pub. info.: Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land.  Part Two  pp.947-951,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4890
3.

Conference Proceedings
Conference Proceedings
3. Application of expert classification system in dynamic monitor of ecology environment
Deng, F. ; Liu, A. ; Li, D. ; Zhang, J. ; Dai, J. ; Zhuo, J.
Pub. info.: Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land.  Part Two  pp.960-965,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4890
4.

Conference Proceedings
Conference Proceedings
4. Investigation of sloping cultivated land on the Loess Plateau with 3S technology
Li, D. ; Liu, A. ; Deng, F. ; Zhang, J. ; Zhuo, J.
Pub. info.: Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land.  Part Two  pp.952-959,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4890