1.

Conference Proceedings

Conference Proceedings
Wolf,H. ; Burchard,A. ; Deicher,M. ; Filz,T. ; Jost,A. ; Lauer,St. ; Magerle,R. ; Ostheimer,V. ; Pfeiffer,W. ; Wichert,Th.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.309-314,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Ott,U. ; Wolf,H. ; Krings,Th. ; Wichert,Th. ; Haヲツlein,H. ; Sielemann,R. ; Deicher,M. ; Newman,R.C. ; Zulehner,W.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1251-1256,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147