1.

Conference Proceedings

Conference Proceedings
Forkel-Wirth,D. ; Achtziger,N. ; Burchard,A. ; Correia,J.C. ; Deicher,M. ; Grillenberger,J. ; Gottschalck,H. ; Licht,T. ; Magerle,R. ; Reisldhner,U. ; Rub,M. ; Toulemonde,M. ; Witthuhn,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.963-968,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Baurichter,A. ; Deicher,M. ; Deubler,S. ; Forkel,D. ; Meier,J. ; Witthuhn,W.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.593-598,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87