1.

Conference Proceedings
Conference Proceedings
1. Emerging Device Solutions for the Post-Classical CMOS Era*
De Meyer, K. ; Collaert, N. ; Kubicek, S. ; Kottontharayil, A. ; van Meer, H. ; Verheyen, P.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.291-305,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-6
2.

Conference Proceedings
Conference Proceedings
2. 0.13 μm CMOS Technology with Optimized Poly-Si/No-Oxide Gate Stack
Kubicek, S. ; Jansen, P. ; Badenes, G. ; Schaekers, M. ; Koldyaev, V. ; Deferm, L. ; De Meyer, K. ; Kerr, D. ; Naem, A.
Pub. info.: ULSI process integration : proceedings of the first international symposium.  pp.193-202,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-18
3.

Conference Proceedings
Conference Proceedings
3. Freeze-out Effects on the Characteristics of Deep Submicron Si MOSFETs in the 77 to 300 K Range
Croon, J. ; Biesemans, S. ; Kubicek, S. ; Simoen, E. ; De Meyer, K. ; Claeys, C.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.187-198,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2