1.

Conference Proceedings
Conference Proceedings
1. New traps for H｡?in boron- and phosphorus-doped silicon
Korpas,L. ; Corbett,J.W. ; Estreicher,S.K.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.27-32,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings
Conference Proceedings
2. Vacancies and {V,Hn} Complexes in Si:Stable Structures,Relative Stability,and Diffusion Properties
Roberson,M.A. ; Estreicher,S.K. ; Korpas,L. ; Corbett,J.W.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1227-1232,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147