1.

Conference Proceedings
Conference Proceedings
1. Infrared photoluminescence characterization of HgCdTe film
Chang,Y. ; Chu,J. ; Ji,R.B. ; Wang,X. ; Huang,G. ; Li,J.F. ; He,L. ; Tang,D.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.182-185,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
2.

Conference Proceedings
Conference Proceedings
2. Recent progress in the study of characterization and properties of HgCdTe at the National Laboratory for Infrared Physics in China
Chu,J. ; Liu,K. ; Chang,Y. ; Liu,P. ; Li,B. ; Guo,S. ; Chen,M. ; Tang,D.
Pub. info.: Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine.  pp.30-38,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3182
3.

Conference Proceedings
Conference Proceedings
3. Fabrication of multielement arrays based on high-Tc superconducting microbolometers
Liu,X.T. ; Liu,Z.H. ; Chang,Y. ; Chu,J.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.532-534,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
4.

Conference Proceedings
Conference Proceedings
4. Optical investigations on pseudomorphic δ-doped AlGaAs/InGaAs/GaAs quantum wells
Wang,X. ; Chang,Y. ; Cao,X. ; Gui,Y. ; Chu,J.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.298-301,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086