1.

Conference Proceedings
Conference Proceedings
1. PROPERTIES OF Pt/Ti CONTACTS TO III-V MATERIALS
Katz, A. ; Nakahara, S. ; Chu, S.N.G. ; Weir, B.E. ; Abernathy, C.R. ; Hobson, W.S. ; Pearton, S.J. ; Savin, W.
Pub. info.: Long-wavelength semiconductor devices, materials, and processes : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.305-312,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 216
2.

Conference Proceedings
Conference Proceedings
2. ORIGIN OF GROWN-IN DISLOCATIONS IN III-V COMPOUND SEMICONDUCTORS EPITAXIAL LAYERS
Nakahara, S. ; Chu, S.N.G.
Pub. info.: Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.45-48,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 62
3.

Conference Proceedings
Conference Proceedings
3. RELATIVE LATTICE PARAMETER MEASUREMENT IN QUATERNARY (InGaAsP) LAYERS ON InP SUBSTRATES USING CONVERGENT BEAM ELECTRON DIFFRACTION
Twigg, M.E. ; Chu, S.N.G. ; Joy, D.C. ; Maher, D.M. ; Macrander, A.T. ; Nakahara, S. ; Chin, A.K.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.147-152,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69
4.

Conference Proceedings
Conference Proceedings
4. Oscillation Behavior of Fe-Doping Profile and FeP Precipitation in Semi-Insulating Fe-Doped InP Grown by Metalorganic Chemical Vapor Deposition
Chu, S.N.G. ; Logan, R.A. ; Ha, N.T. ; Nakahara, S. ; Karlicek, R.F., Jr. ; Grenko, J.A.
Pub. info.: Proceedings of the Symposium on Large Area Wafer Growth and Processing for Electronic and Photonic Devices and the twentieth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XX).  pp.185-194,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-18